voltage-time characteristic
21radiation measurement — ▪ technology Introduction technique for detecting the intensity and characteristics of ionizing radiation, such as alpha, beta, and gamma rays or neutrons, for the purpose of measurement. The term ionizing radiation refers to those… …
22Langmuir probe — A Langmuir probe is a device named after Nobel Prize winning physicist Irving Langmuir, used to determine the electron temperature, electron density, and electric potential of a plasma. It works by inserting one or more electrodes into a plasma,… …
23Diode — Figure 1: Closeup of a diode, showing the square shaped semiconductor crystal (black object on left) …
24Memristor — Type Passive Working principle Memristance Invented Leon Chua (1971) First production HP Labs (2008) Electronic symbol …
25crystal — crystallike, adj. /kris tl/, n., adj., v., crystaled, crystaling or (esp. Brit.) crystalled, crystalling. n. 1. a clear, transparent mineral or glass resembling ice. 2. the transparent form of crystallized quartz. 3. Chem., Mineral. a solid body… …
26Vacuum tube — This article is about the electronic device. For experiments in an evacuated pipe, see free fall. For the transport system, see pneumatic tube. Modern vacuum tubes, mostly miniature style In electronics, a vacuum tube, electron tube (in North… …
27Transmission line — This article is about the radio frequency transmission line. For the power transmission line, see electric power transmission. In communications and electronic engineering, a transmission line is a specialized cable designed to carry alternating… …
28Crystal — /kris tl/, n. 1. a city in SE Minnesota, near Minneapolis. 25,543. 2. a female given name. * * * I Any solid material whose atoms are arranged in a definite pattern and whose surface regularity reflects its internal symmetry. Each of a crystal s… …
29Fuse (electrical) — A miniature time delay fuse used to protect electronic equipment, rated 0.3 amperes at 250 volts. 1.25 inches (about 32 mm) long …
30Test probe — Typical passive oscilloscope probe being used for testing an integrated circuit. A test probe (test lead, test prod, or scope probe) is a physical device used to connect electronic test equipment to the device under test (DUT). They range from… …
