the beam of electrons
31Electron beam machining — (EBM) is a machining process where high velocity electrons are directed toward a work piece, creating heat and vaporizing the material. Applications of this process are annealing, metal removal, and welding (see Electron Beam Welding). EBM can be …
32Particle beam — A particle beam is an accelerated stream of charged particles or neutrons (often moving at very near the speed of light) which may be directed by magnets and focused by electrostatic lenses, although they may also be self focusing (see… …
33Ion Beam Mixing — is a process for adhering two multilayers, especially a substrate and deposited surface layer. The process involves bombarding layered samples with doses of ion radiation in order to promote mixing at the interface, and generally serves as a… …
34Diffraction des électrons — La diffraction des électrons est une technique utilisée pour l étude de la matière qui consiste à bombarder d électrons un échantillon et à observer la figure de diffraction résultante. Ce phénomène se produit en raison de la dualité onde… …
35Electron beam ion trap — (or its acronym EBIT) is used in physics to denote an electromagnetic bottle that produces and confines highly charged ions. It was invented by R. Marrs [Levine et al, 1988] and M. Levine at LLNL.An EBIT uses an electron beam focused by means of… …
36Molecular beam epitaxy — A simple sketch showing the main components and rough layout and concept of the main chamber in a Molecular Beam Epitaxy system Molecular beam epitaxy (MBE) is one of several methods of depositing single crystals. It was invented in the late… …
37Molecular-beam epitaxy — (MBE), is one of several methods of depositing single crystals. It was invented in the late 1960s at Bell Telephone Laboratories by J. R. Arthur and Alfred Y. Cho.MethodMolecular beam epitaxy takes place in high vacuum or ultra high vacuum (10−8… …
38Electron beam induced current — (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is used to identify buried junctions or defects in semiconductors, or to examine minority… …
39Electron Beam Melting — (EBM) is a type of rapid prototyping for metal parts. It is often classified as a rapid manufacturing method. The technology manufactures parts by melting metal powder layer per layer with an electron beam in a high vacuum. Unlike some metal… …
40Optical beam induced current — (OBIC) is a semiconductor analysis technique performed using laser signal injection. The technique uses a scanning laser beam to create electron–hole pairs in a semiconductor sample. This induces a current which may be analyzed to determine the… …
