scanning source
1Scanning Electron Microscopy — Microscopie électronique à balayage Pour les articles homonymes, voir MEB, SEM et Microscope. Microscope électronique à balayage JEOL JSM 6340F …
2Scanning Helium Ion Microscope — A Scanning Helium Ion Microscope (SHIM) is a new imaging technology based on a scanning helium ion beam. [ [http://nanotechwire.com/news.asp?nid=2120 ntid=121 pg=1 Nanotechwire press release announcing new microscope, retrieved December 13, 2006] …
3Scanning transmission electron microscopy — A scanning transmission electron microscope (STEM) is a type of transmission electron microscope. With it, the electrons pass through the specimen, but, as in scanning electron microscopy, the electron optics focus the beam into a narrow spot… …
4Scanning (light) source — Сканирующий источник света (цветокорректор) …
5Audience scanning — An audience watches a laser light show during the SIB trade fair in Rimini, Italy in 2002. Audience scanning (sometimes called crowd scanning ) occurs when a laser beam is directed toward the people observing a laser show or display. Although… …
6Confocal laser scanning microscopy — (CLSM or LSCM) is a technique for obtaining high resolution optical images with depth selectivity.[1] The key feature of confocal microscopy is its ability to acquire in focus images from selected depths, a process known as optical sectioning.… …
7Near-field scanning optical microscope — Near field scanning optical microscopy (NSOM/SNOM) is a microscopic technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. This is done by placing the detector very… …
8List of open source software packages — This is a list of open source software packages: computer software licensed under an open source license. Software that fits the Free software definition may be more appropriately called free software; the GNU project in particular objects to… …
9Cargo scanning — Intermodal Shipping Containers Cargo scanning or non intrusive inspection (NII) refers to non destructive methods of inspecting and identifying goods in transportation systems. It is often used for scanning of intermodal freight …
10Spin polarized scanning tunneling microscopy — (SP STM) is a specialized application of scanning tunneling microscopy (STM) that can provide detailed information of magentic phenomena on the single atom scale additional to the atomic topology gained with STM. SP STM was developed by Roland… …
