scanning element
31Physical Sciences — ▪ 2009 Introduction Scientists discovered a new family of superconducting materials and obtained unique images of individual hydrogen atoms and of a multiple exoplanet system. Europe completed the Large Hadron Collider, and China and India took… …
32surface analysis — ▪ chemistry Introduction in analytical chemistry (chemistry), the study of that part of a solid that is in contact with a gas or a vacuum. When two phases of matter are in contact, they form an interface. The term surface is usually… …
33Árbol biselado — Un Árbol biselado o Árbol Splay es un Árbol binario de búsqueda auto balanceable, con la propiedad adicional de que a los elementos accedidos recientemente se accederá más rápidamente en accesos posteriores. Realiza operaciones básicas como… …
34Michael Francis Tompsett — is a British born physicist and former researcher at English Electric Valve Company, [1] who later moved to Bell Labs in America. He is best known as the inventor of Charge Coupled Device (CCD) Imagers used for imaging in devices such as digital… …
35Linked list — In computer science, a linked list is a data structure consisting of a group of nodes which together represent a sequence. Under the simplest form, each node is composed of a datum and a reference (in other words, a link) to the next node in the… …
36Video camera tube — In older video cameras, before the mid to late 1980s, a video camera tube or pickup tube was used instead of a charge coupled device (CCD) for converting an optical image into an electrical signal. Several types were in use from the 1930s to the… …
37Cathode ray tube — Cutaway rendering of a color CRT: 1. Three Electron guns (for red, green, and blue phosphor dots) 2. Electron beams 3. Focusing coils 4. Deflection coils 5. Anode connection 6. Mask for separating beams for red,… …
38Atomic force microscope — The atomic force microscope (AFM) or scanning force microscope (SFM) is a very high resolution type of scanning probe microscope, with demonstrated resolution of fractions of a nanometer, more than 1000 times better than the optical diffraction… …
39Failure analysis — is the process of collecting and analyzing data to determine the cause of a failure. It is an important discipline in many branches of manufacturing industry, such as the electronics industry, where it is a vital tool used in the development of… …
40Antenna measurement — techniques refers to the testing of antennas to ensure that the antenna meets specifications or simply to characterize it. Typical parameters of antennas are gain, radiation pattern, beamwidth, polarization, and impedance.The antenna pattern is… …
