near-field scanning technique
1Near-field scanning optical microscope — Near field scanning optical microscopy (NSOM/SNOM) is a microscopic technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. This is done by placing the detector very… …
2Near-field scanner — Electromagnetic near field scanner could be defined as a measurement system to determine a spatial distribution of an electrical quantity provided by a single or multiple field probes acquired in the near field region of a device under test… …
3Electromagnetic near-field scanner — could be defined as a measurement system to determine a spatial distribution of an electrical quantity provided by a single or multiple field probes acquired in the near field region of a device under test possibly accompanied by the associated… …
4Scanning voltage microscopy — (SVM) sometimes also called nanopotentiometry is a scientific experimental technique based on atomic force microscopy. A conductive probe, usually only a few nanometers wide at the tip, is placed in full contact with an operational electronic or… …
5Scanning tunneling microscope — Image of reconstruction on a clean Gold(100) surface …
6Scanning probe microscopy — Part of a series of articles on Nanotechnology …
7Scanning tunneling spectroscopy — (STS) is a powerful experimental technique in scanning tunneling microscopy (STM) that uses a scanning tunneling microscope (STM) to probe the local density of electronic states (LDOS) and band gap of surfaces and materials on surfaces at the… …
8Scanning electron microscope — These pollen grains taken on an SEM show the characteristic depth of field of SEM micrographs …
9Confocal laser scanning microscopy — (CLSM or LSCM) is a technique for obtaining high resolution optical images with depth selectivity.[1] The key feature of confocal microscopy is its ability to acquire in focus images from selected depths, a process known as optical sectioning.… …
10Dark field microscopy — (dark ground microscopy) describes microscopy methods, in both light and electron microscopy, which exclude the unscattered beam from the image. As a result, the field around the specimen (i.e. where there is no specimen to scatter the beam) is… …
