microelectronic element
31Columbia School of Engineering and Applied Science — School of Engineering and Applied Science redirects here. For other uses, see School of Engineering and Applied Science (disambiguation). Fu Foundation School of Engineering and Applied Science Established …
32Design for testing — Design for Test (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and… …
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