ion tunneling

  • 61Nanolithography — Part of a series of articles on Nanoelectronics Single molecule electronics …

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  • 62History of mass spectrometry — The history of mass spectrometry dates back more than one hundred years and has its roots in physical and chemical studies regarding the nature of matter. The study of gas discharges in the mid 19th century led to the discovery of anode and… …

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  • 63Scanning voltage microscopy — (SVM) sometimes also called nanopotentiometry is a scientific experimental technique based on atomic force microscopy. A conductive probe, usually only a few nanometers wide at the tip, is placed in full contact with an operational electronic or… …

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  • 64Millipede memory — Computer memory types Volatile RAM DRAM (e.g., DDR SDRAM) SRAM In development T RAM Z RAM TTRAM Historical Delay line memory Selectron tube Williams tube Non volatile …

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  • 65Magnetic resonance force microscopy — (MRFM) is an imaging technique that acquires magnetic resonance images (MRI) at nanometer scales, and possibly at atomic scales in the future. MRFM is potentially able to observe protein structures which cannot be seen using X ray crystallography …

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  • 66John Randall (nanotechnologist) — John Neal Randall is an American Electrical Engineer and nanotechnologist. As of 2006, Chief Technical Officer of Zyvex Corporartion. Previously he worked at Texas Instruments from 1985 to 2001, and Lincoln Laboratory (part of the MIT Corporation …

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  • 67Feature-oriented scanning — (FOS)[1][2][3] is a method intended for high precision measurement of nanotopography as well as other surface properties and characteristics on a scanning probe microscope (SPM) using features (objects) of the surface as reference points of the… …

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  • 68Feature-oriented positioning — (FOP)[1][2] is a method of precise movement of the scanning microscope probe across the surface under investigation. With this method, surface features (objects) are used as reference points for microscope probe attachment. Actually, FOP is a… …

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  • 69Counter-scanning — (CS)[1] is a method for measuring surface topography with a scanning probe microscope enabling correction of raster distortions resulted from drift of the microscope probe relative to the surface being measured. Two surface scans, viz. direct… …

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  • 70Graphene nanoribbons — (also called nano graphene ribbons), often abbreviated GNRs, are thin strips of graphene or unrolled single walled carbon nanotubes. Graphene ribbons were originally introduced as a theoretical model by Mitsutaka Fujita and co authors to examine… …

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