ion beam
61Electron beam ion trap — (or its acronym EBIT) is used in physics to denote an electromagnetic bottle that produces and confines highly charged ions. It was invented by R. Marrs [Levine et al, 1988] and M. Levine at LLNL.An EBIT uses an electron beam focused by means of… …
62Electron beam physical vapor deposition — or EBPVD is a form of physical vapor deposition in which a target anode is bombarded with an electron beam given off by a charged tungsten filament under high vacuum. The electron beam causes atoms from the target to transform into the gaseous… …
63Static secondary ion mass spectrometry — Static secondary ion mass spectrometry, or static SIMS is a technique for chemical analysis including elemental composition and chemical structure of the uppermost atomic or molecular layer of a solid which may be a metal, semiconductor or… …
64Electrostatic ion thruster — The electrostatic ion thruster is a kind of design for ion thrusters (a kind of highly efficient low thrust spacecraft propulsion running on electrical power). These designs use high voltage electrodes in order to accelerate ions with… …
65Relativistic Heavy Ion Collider — Hadron colliders Caption=The Relativistic Heavy Ion Collider at Brookhaven National Laboratory. Some of the superconducting magnets were manufactured by Northrop Grumman Corp. at Bethpage, New York. Note especially the second, independent ring… …
66Scanning Helium Ion Microscope — Ein Helium Ionen Mikroskop (auch: Scanning Helium Ion Microscope, SHIM) ist ein bildgebendes Verfahren, welches darauf basiert, dass ein Helium Ionen Strahl das zu untersuchende Objekt abtastet[1]. Das Verfahren ähnelt dem eines… …
67Plasma-immersion ion implantation — (PIII) [cite book | title = Materials Science of Thin Films | author = Milton Ohring | publisher = Academic Press | year = 2002 | isbn = 0125249756 | url = http://books.google.com/books?id=SOt yFjV xwC pg=PA267… …
68Charged particle beam — A charged particle beam is a spatially localized group of electrically charged particles that have approximately the same velocity (speed and direction). The kinetic energies of the particles are typically measured in keV or MeV, much larger than …
69Scanning Helium Ion Microscope — A Scanning Helium Ion Microscope (SHIM) is a new imaging technology based on a scanning helium ion beam. [ [http://nanotechwire.com/news.asp?nid=2120 ntid=121 pg=1 Nanotechwire press release announcing new microscope, retrieved December 13, 2006] …
70Electron beam lithography — (often abbreviated as e beam lithography) is the practice of scanning a beam of electrons in a patterned fashion across a surface covered with a film (called the resist),cite book |last= McCord |first=M. A. |coauthors=M. J. Rooks |title=… …
