free ion
31ion — An atom or group of atoms carrying an electric charge by virtue of having gained or lost one or more electrons. Ions charged with negative electricity (anions) travel toward a positive pole (anode); those charged with positive electricity… …
32free electron — noun electron that is not attached to an atom or ion or molecule but is free to move under the influence of an electric field • Hypernyms: ↑electron, ↑negatron * * * noun 1. : an electron within a conducting substance (as a metal) but not… …
33ion — noun Etymology: Greek, neuter of iōn, present participle of ienai to go more at issue Date: circa 1834 1. an atom or group of atoms that carries a positive or negative electric charge as a result of having lost or gained one or more electrons 2.… …
34free radical — /fri ˈrædɪkəl/ (say free radikuhl) noun a molecule or ion having one or more unpaired electrons and thus being highly reactive, which exists independently for short periods during the course of a chemical reaction, or for longer periods under… …
35free radical — noun any molecule, ion or atom that has one or more unpaired electrons; they are generally highly reactive and often only occur as transient species …
36ion pair — the free electron and the positively charged residual atom that result from the ejection of an orbital electron by ionizing radiation …
37freies Ion — laisvasis jonas statusas T sritis fizika atitikmenys: angl. free ion vok. freies Ion, n rus. свободный ион, m pranc. ion libre, m …
38Nearly-free electron model — Electronic structure methods Tight binding Nearly free electron model Hartree–Fock method Modern valence bond Generalized valence bond Møller–Plesset perturbat …
39Secondary ion mass spectrometry — Infobox chemical analysis name = Secondary ion mass spectrometry caption =CAMECA IMS3f Magnetic SIMS Instrument acronym = SIMS classification =Mass spectrometry analytes = Solid surfaces, thin films related = Fast atom bombardment… …
40Static secondary ion mass spectrometry — Static secondary ion mass spectrometry, or static SIMS is a technique for chemical analysis including elemental composition and chemical structure of the uppermost atomic or molecular layer of a solid which may be a metal, semiconductor or… …
