field ion emission
21Electrostatic ion thruster — The electrostatic ion thruster is a kind of design for ion thrusters (a kind of highly efficient low thrust spacecraft propulsion running on electrical power). These designs use high voltage electrodes in order to accelerate ions with… …
22Particle-Induced X-ray Emission — or Proton Induced X ray Emission (PIXE) is a technique used in the determining of the elemental make up of a material or sample. When a material is exposed to an ion beam, atomic interactions occur that give off EM radiation of wavelengths in the …
23Particle-induced X-ray emission — or proton induced X ray emission (PIXE) is a technique used in the determining of the elemental make up of a material or sample. When a material is exposed to an ion beam, atomic interactions occur that give off EM radiation of wavelengths in the …
24Focused ion beam — Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor and materials science fields for site specific analysis, deposition, and ablation of materials. The FIB is a scientific instrument that resembles a… …
25Low-energy ion scattering — LEIS redirects here; for the Hawaiian garland see Lei (Hawaii). Low energy ion scattering spectroscopy (LEIS), sometimes referred to simply as ion scattering spectroscopy (ISS), is a surface sensitive analytical technique used to characterize the …
26National High Magnetic Field Laboratory — logo the National High Magnetic Field Laboratory (NHMFL) is a laboratory at Florida State University, with branches in University of Florida and at Los Alamos National Laboratory. NHMFL develops and research at magnetic fields for research in… …
27Inductively coupled plasma atomic emission spectroscopy — (ICP AES), also referred to as inductively coupled plasma optical emission spectrometry (ICP OES), is an analytical technique used for the detection of trace metals. It is a type of emission spectroscopy that uses the inductively coupled plasma… …
28Near-field scanning optical microscope — Near field scanning optical microscopy (NSOM/SNOM) is a microscopic technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. This is done by placing the detector very… …
29carbonium ion — /kahr boh nee euhm/ an organic ion containing a positively charged carbon atom (opposed to carbanion). [CARBON + IUM] * * * ▪ chemical ion Introduction any member of a class of organic molecules with positive charges localized at a carbon… …
30Gas cluster ion beam — Gas Cluster Ion Beams (GCIB) is a new technology for nano scale modification of surfaces. It can smooth a wide variety of surface material types to within an angstrom of roughness without subsurface damage. It is also used to chemically alter… …
