electron-ion emission

  • 31Particle-Induced X-ray Emission — or Proton Induced X ray Emission (PIXE) is a technique used in the determining of the elemental make up of a material or sample. When a material is exposed to an ion beam, atomic interactions occur that give off EM radiation of wavelengths in the …

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  • 32Light Amplification by Stimulated Emission of Radiation — Laser Pour les articles homonymes, voir Laser (homonymie). Rayon laser à travers un dispositif optique …

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  • 33Particle-induced X-ray emission — or proton induced X ray emission (PIXE) is a technique used in the determining of the elemental make up of a material or sample. When a material is exposed to an ion beam, atomic interactions occur that give off EM radiation of wavelengths in the …

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  • 34carbonium ion — /kahr boh nee euhm/ an organic ion containing a positively charged carbon atom (opposed to carbanion). [CARBON + IUM] * * * ▪ chemical ion Introduction       any member of a class of organic molecules with positive charges localized at a carbon… …

    Universalium

  • 35Field emission display — A field emission display (FED) is a display technology that incorporates flat panel display technology that uses large area field electron emission sources to provide electrons that strike colored phosphor to produce a color image as a electronic …

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  • 36Secondary emission — is a phenomenon where additional electrons, called secondary electrons, are emitted from the surface of a material when an incident particle (often, charged particle such as electron or ion) impacts the material with sufficient energy. The number …

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  • 37Focused ion beam — Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor and materials science fields for site specific analysis, deposition, and ablation of materials. The FIB is a scientific instrument that resembles a… …

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  • 38Auger electron spectroscopy — (AES; Auger pronounced|oːʒeː in French) is a common analytical technique used specifically in the study of surfaces and, more generally, in the area of materials science. Underlying the spectroscopic technique is the Auger effect, as it has come… …

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  • 39Electrostatic ion thruster — The electrostatic ion thruster is a kind of design for ion thrusters (a kind of highly efficient low thrust spacecraft propulsion running on electrical power). These designs use high voltage electrodes in order to accelerate ions with… …

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  • 40Reflection high energy electron diffraction — (RHEED) is a technique used to characterize the surface of crystalline materials. RHEED systems gather information only from the surface layer of the sample, which distinguishes RHEED from other materials characterization methods that rely also… …

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