electron probe analysis
1electron probe — noun An X ray device that bombards the specimen under examination with a very narrow beam of electrons, allowing non destructive analysis • • • Main Entry: ↑electron …
2Electron microscope — Diagram of a transmission electron microscope A 197 …
3Electron microprobe — An electron microprobe (EMP), also known as an electron probe microanalyser (EPMA) is an analytical tool used to non destructively determine the chemical composition of small volumes of solid materials. It works similarly to a scanning electron… …
4Transmission electron microscopy — A TEM image of the polio virus. The polio virus is 30 nm in size.[1] Transmission electron microscopy (TEM) is a microscopy technique whereby a beam of electrons is transmitted through an ultra thin specimen, interacting with the specimen as it… …
5List of materials analysis methods — List of materials analysis methods: Contents: Top · 0–9 · A B C D E F G H I J K L M N O P Q R S T U V W X Y Z μSR see Muon spin spectroscopy …
6Field electron emission — It is requested that a diagram or diagrams be included in this article to improve its quality. For more information, refer to discussion on this page and/or the listing at Wikipedia:Requested images. Field emission (FE) (also known as field… …
7Environmental scanning electron microscope — Wool fibers imaged in an ESEM by the use of two symmetrical plastic scintillating backscattered electron detectors …
8Langmuir probe — A Langmuir probe is a device named after Nobel Prize winning physicist Irving Langmuir, used to determine the electron temperature, electron density, and electric potential of a plasma. It works by inserting one or more electrodes into a plasma,… …
9surface analysis — ▪ chemistry Introduction in analytical chemistry (chemistry), the study of that part of a solid that is in contact with a gas or a vacuum. When two phases of matter are in contact, they form an interface. The term surface is usually… …
10Scanning electron microscope — These pollen grains taken on an SEM show the characteristic depth of field of SEM micrographs …
