electron beam microscope

  • 1Electron beam induced deposition — (EBID) is a process of decomposing gaseous molecules by electron beam leading to deposition of non volatile fragments onto a nearby substrate. Process Focused electron beam of scanning electron microscope (SEM) or scanning transmission electron… …

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  • 2Electron beam lithography — (often abbreviated as e beam lithography) is the practice of scanning a beam of electrons in a patterned fashion across a surface covered with a film (called the resist),cite book |last= McCord |first=M. A. |coauthors=M. J. Rooks |title=… …

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  • 3Electron beam induced current — (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is used to identify buried junctions or defects in semiconductors, or to examine minority… …

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  • 4Electron Beam Prober — The Electron Beam Prober (E beam Prober) is a specialized adaption of a standard Scanning Electron Microscope (SEM) that is used for semiconductor failure analysis. While a standard SEM may be operated in a voltage range of 25KeV to 30KeV, the E… …

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  • 5electron beam — ▪ physics       stream of electrons (as from a betatron) generated by heat ( thermionic emission), bombardment of charged atoms or particles (secondary electron emission), or strong electric fields (field emission). Electrons may be collimated by …

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  • 6Electron diffraction — is a technique used to study matter by firing electrons at a sample and observing the resulting interference pattern. This phenomenon occurs due to the wave particle duality, which states that a particle of matter (in this case the incident… …

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  • 7electron microscope — n an electron optical instrument in which a beam of electrons is used to produce an enlarged image of a minute object electron microscopist n electron microscopy n * * * a microscope that uses a beam of electrons as a radiation source for viewing …

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  • 8Electron crystallography — is a method to determine the arrangement of atoms in solids using a transmission electron microscope (TEM). Contents 1 Comparison with X ray crystallography 2 Radiation damage 3 Protein structures determined by electron crystallography …

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  • 9Electron optics — deals with the focusing and deflection of electrons using magnetic and/or electrostatic fields. See also * Charged particle beam * Electron beam technology * Electron microscope * Ernst Ruska References * [http://www.ml.afrl.af.mil/facilities/mll …

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  • 10electron lens — n. a configuration of electric or magnetic fields, or a combination of both, that serves to focus or deflect an electron beam, as in an electron microscope …

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