drain bolt
11run out — verb 1. become used up; be exhausted (Freq. 5) Our supplies finally ran out • Hypernyms: ↑end, ↑stop, ↑finish, ↑terminate, ↑cease • Verb Frames …
12Horse slaughter — is the practice of slaughtering horses for meat. These animals come from mainly from auctions, where they re sold by private sellers and breeders. Often horses are sent to auction and sold to slaughter without the owner s knowledge or consent by… …
13List of Di-Gata Defenders characters — This is the list of both known major and minor characters for the animated television series Di Gata Defenders.Main Six DefendersSeth (voiced by Noah Cappe):At the age of fourteen (age at Trouble in Paradise ) Seth is the leader of the Di Gata… …
14Pocket God — This page is about the computer video game. For the comic, see Pocket God (comics). Pocket God Version 1.41.5 icon of Pocket God.[1] Develope …
15Dwain Chambers — Personal information Nationality English Born 5 April 1978 (1978 04 05) (age 33) Lo …
16Door — For other uses, see Door (disambiguation). A door is a movable structure used to open and close off an entrance, typically consisting of a panel that swings on hinges or that slides or rotates inside of a space. When open, they admit ventilation… …
17High Elves (Warhammer) — In Games Workshop s Warhammer Fantasy setting, the High Elves, or the Asur as they name themselves, are a race of Elves who live on the Isle of Ulthuan, analogous to Atlantis. The High Elf army appears to bear resemblance to the Byzantine Empire… …
18Shinzo — マシュランボー (Mushrambo) Genre Adventure, Drama, Fantasy, Science Fiction …
19Dark Kingdom — This article is about the villain group. For the corresponding story arc, see List of Sailor Moon episodes (season 1). For other uses, see Dark Kingdom (disambiguation). Sailor Moon villain group The Dark Kingdom as seen in the anime, with Queen… …
20Antenna effect — The antenna effect, more formally plasma induced gate oxide damage, is an effect that can potentially cause yield and reliability problems during the manufacture of MOS integrated circuits [ T. Watanabe, Y. Yoshida, “Dielectric Breakdown of Gate… …
