contact scanning
1Scanning voltage microscopy — (SVM) sometimes also called nanopotentiometry is a scientific experimental technique based on atomic force microscopy. A conductive probe, usually only a few nanometers wide at the tip, is placed in full contact with an operational electronic or… …
2Scanning capacitance microscopy — (SCM) is a variety of scanning probe microscopy in which a narrow probe electrode is held just above the surface of a sample and scanned across the sample. SCM characterizes the surface of the sample using information obtained from the change in… …
3Scanning probe microscopy — Part of a series of articles on Nanotechnology …
4Scanning Electron Microscopy — Microscopie électronique à balayage Pour les articles homonymes, voir MEB, SEM et Microscope. Microscope électronique à balayage JEOL JSM 6340F …
5Near-field scanning optical microscope — Near field scanning optical microscopy (NSOM/SNOM) is a microscopic technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. This is done by placing the detector very… …
6Coordinate-measuring machine — A coordinate measuring machine (CMM) is a device for measuring the physical geometrical characteristics of an object. This machine may be manually controlled by an operator or it may be computer controlled. Measurements are defined by a probe… …
7Dimensional metrology — is the science of calibrating and using physical measurement equipment to quantify the physical size of or distance from any given object. Inspection is a critical step in product development and quality control. Dimensional Metrology requires… …
8Staphylococcus aureus — Scanning electron micrograph of S. aureus, 20,000 times enlargement, false color added Scientific classification Domain: Bacteria …
9Photoconductive atomic force microscopy — (pc AFM) is a scientific technique.. Multi layer photovoltaic cells have gained popularity since mid 1980s.[1] At the time, research was primarily focused on single layer photovoltaic (PV) devices between two electrodes, in which PV properties… …
10Atomic force microscope — The atomic force microscope (AFM) or scanning force microscope (SFM) is a very high resolution type of scanning probe microscope, with demonstrated resolution of fractions of a nanometer, more than 1000 times better than the optical diffraction… …
