beam specimen
1Focused ion beam — Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor and materials science fields for site specific analysis, deposition, and ablation of materials. The FIB is a scientific instrument that resembles a… …
2Environmental scanning electron microscope — Wool fibers imaged in an ESEM by the use of two symmetrical plastic scintillating backscattered electron detectors …
3Scanning electron microscope — These pollen grains taken on an SEM show the characteristic depth of field of SEM micrographs …
4ESEM — stands for environmental scanning electron microscope. This is a scanning electron microscope (SEM) that allows a gaseous environment in the specimen chamber. Whereas all conventional microscopes operate in vacuum, the ESEM has added a new… …
5Properties of concrete — Concrete has relatively high compressive strength, but significantly lower tensile strength, and as such is usually reinforced with materials that are strong in tension (often steel). The elasticity of concrete is relatively constant at low… …
6Transmission electron microscopy — A TEM image of the polio virus. The polio virus is 30 nm in size.[1] Transmission electron microscopy (TEM) is a microscopy technique whereby a beam of electrons is transmitted through an ultra thin specimen, interacting with the specimen as it… …
7microscope — /muy kreuh skohp /, n. 1. an optical instrument having a magnifying lens or a combination of lenses for inspecting objects too small to be seen or too small to be seen distinctly and in detail by the unaided eye. 2. (cap.) Astron. the… …
8Electron microscope — Diagram of a transmission electron microscope A 197 …
9Optical dilatometer — An optical dilatometer is a non contact device able to measure thermal expansions or sintering kinetics of any kind of materials, unlike traditional push rod dilatometer, it can push up to the dilatometric softening of the specimen. It is a… …
10Kikuchi line — s, they are easily seen in diffraction from regions of the specimen thick enough for multiple scattering [David B. Williams and C. Barry Carter (1996) Transmission electron microscopy: A textbook for materials science (Plenum Press, NY) ISBN 0… …
