area electron source

area electron source
распределённый источник электронов

Англо-русский словарь технических терминов. 2005.

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  • Electron microscope — Diagram of a transmission electron microscope A 197 …   Wikipedia

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  • Electron beam lithography — (often abbreviated as e beam lithography) is the practice of scanning a beam of electrons in a patterned fashion across a surface covered with a film (called the resist),cite book |last= McCord |first=M. A. |coauthors=M. J. Rooks |title=… …   Wikipedia

  • Electron mobility — This article is about the mobility for electrons and holes in metals and semiconductors. For the general concept, see Electrical mobility. In solid state physics, the electron mobility characterizes how quickly an electron can move through a… …   Wikipedia

  • electron tube — an electronic device that consists, typically, of a sealed glass bulb containing two or more electrodes: used to generate, amplify, and rectify electric oscillations and alternating currents. Also called electronic tube. Cf. gas tube, vacuum tube …   Universalium

  • Electron avalanche — An electron avalanche is a process in which a number of free electrons in a medium (usually a gas) are subjected to strong acceleration by an electric field, ionizing the medium s atoms by collision (called impact ionization), thereby forming new …   Wikipedia

  • Electron toolset — The Electron toolset was developed by Obsidian Entertainment and is included in the computer role playing game Neverwinter Nights 2 . It allows people to design their own adventures (known as a module ) and distribute them for others who own the… …   Wikipedia

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  • Transmission electron microscopy — A TEM image of the polio virus. The polio virus is 30 nm in size.[1] Transmission electron microscopy (TEM) is a microscopy technique whereby a beam of electrons is transmitted through an ultra thin specimen, interacting with the specimen as it… …   Wikipedia

  • Reflection high energy electron diffraction — (RHEED) is a technique used to characterize the surface of crystalline materials. RHEED systems gather information only from the surface layer of the sample, which distinguishes RHEED from other materials characterization methods that rely also… …   Wikipedia

  • Low-energy electron microscopy — Low energy electron microscopy, or LEEM, is a technique used by surface scientists to study surface structure at mesoscopic scale on conducting and semiconducting materials. It is based on imaging the electrons elastically scattered from the… …   Wikipedia


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