- dislocation-initiated stacking faults
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физ. дефекты упаковки, порождённые дислокацией
Англо-русский словарь технических терминов. 2005.
Англо-русский словарь технических терминов. 2005.
Diffraction topography — (short: topography ) is an X ray imaging technique based on Bragg diffraction. Diffraction topographic images ( topographs ) record the intensity profile of a beam of X rays (or, sometimes, neutrons) diffracted by a crystal. A topograph thus… … Wikipedia