- diffraction peak
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дифракционный пик
Англо-русский словарь технических терминов. 2005.
diffraction peak
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Diffraction topography — (short: topography ) is an X ray imaging technique based on Bragg diffraction. Diffraction topographic images ( topographs ) record the intensity profile of a beam of X rays (or, sometimes, neutrons) diffracted by a crystal. A topograph thus… … Wikipedia
Powder diffraction — is a scientific technique using X ray, neutron, or electron diffraction on powder or microcrystalline samples for structural characterization of materials. [B.D. Cullity Elements of X ray Diffraction Addison Wesley Mass. 1978] Explanation Ideally … Wikipedia
Coherent diffraction imaging — A diffraction pattern of a gold nanocrystal formed from using a nano area beam of coherent X rays. This reciprocal space diffraction image was taken by Ian Robinson s Group to be used in the reconstruction of a real space coherent x ray… … Wikipedia
Dynamical theory of diffraction — The dynamical theory of diffraction describes the interaction of waves with a regular lattice. The wave fields traditionally described are X rays, neutrons or electrons and the regular lattice, atomic crystal structures or nanometer scaled multi… … Wikipedia
Bragg diffraction — (also referred to as the Bragg formulation of X ray diffraction) was first proposed by William Lawrence Bragg and William Henry Bragg in 1913 in response to their discovery that crystalline solids produced surprising patterns of reflected X rays… … Wikipedia
International Centre for Diffraction Data — The International Centre for Diffraction Data (ICDD) maintains a database of powder diffraction patterns, the Powder Diffraction File (PDF), including the d spacings (related to angle of diffraction) and relative intensities of observable… … Wikipedia
Shape factor (X-ray diffraction) — A shape factor is used in x ray diffraction and crystallography to correlate the size of sub micrometre particles, or crystallites, in a solid to the broadening of a peak in a diffraction pattern. In the Scherrer equation,: au = frac {K… … Wikipedia
Rietveld refinement — is a technique devised by Hugo Rietveld for use in the characterisation of crystalline materials. The neutron and x ray diffraction of powder samples results in a pattern characterised by peaks in intensity at certain positions. The height, width … Wikipedia
Helium atom scattering — (HAS) is a surface analysis technique used in materials science. HAS provides information about the surface structure and lattice dynamics of a material by measuring the diffracted atoms from a monochromatic helium beam incident on the sample.… … Wikipedia
Structure factor — In physics, in the area of crystallography, the structure factor of a crystal is a mathematical description of how the crystal scatters incident radiation. The structure factor is a particularly useful tool in the interpretation of interference… … Wikipedia
clay mineral — any of a group of hydrous aluminum silicate minerals, as kaolinite, illite, and montmorillonite, that constitute the major portion of most clays. [1945 50] * * * Any of a group of important hydrous aluminum silicates with a layered structure and… … Universalium
