- X-ray dispersive analysis
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рентгеновский дисперсионный анализ
Англо-русский словарь технических терминов. 2005.
X-ray dispersive analysis
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Ray tracing (physics) — In physics, ray tracing is a method for calculating the path of waves or particles through a system with regions of varying propagation velocity, absorption characteristics, and reflecting surfaces. Under these circumstances, wavefronts may bend … Wikipedia
X-ray fluorescence — (XRF) is the emission of characteristic secondary (or fluorescent) X rays from a material that has been excited by bombarding with high energy X rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis,… … Wikipedia
X-ray photoelectron spectrometry — Spectrométrie de fluorescence X Pour les articles homonymes, voir SFX, FX et XRF. Un spectromètre de fluorescence X Philips PW1606 avec manutention automatiq … Wikipédia en Français
List of materials analysis methods — List of materials analysis methods: Contents: Top · 0–9 · A B C D E F G H I J K L M N O P Q R S T U V W X Y Z μSR see Muon spin spectroscopy … Wikipedia
X-ray — [ 22 December 1895 and presented to Professor Ludwig Zehnder of the Physik Institut, University of Freiburg, on 1 January 1896. The dark oval on the third finger is a shadow produced by her ring. [cite book last = Kevles first =Bettyann Holtzmann … Wikipedia
Energy-dispersive X-ray spectroscopy — (EDS, EDX or EDXRF) is an analytical technique used for the elemental analysis or chemical characterization of a sample. As a type of spectroscopy, it relies on the investigation of a sample through interactions between electromagnetic radiation… … Wikipedia
Wavelength dispersive X-ray spectroscopy — The Wavelength dispersive X ray spectroscopy (WDXRF or WDS) is a method used to count the number of X rays of a specific wavelength diffracted by a crystal. The wavelength of the impinging x ray and the crystal s lattice spacings are related by… … Wikipedia
Particle-induced X-ray emission — or proton induced X ray emission (PIXE) is a technique used in the determining of the elemental make up of a material or sample. When a material is exposed to an ion beam, atomic interactions occur that give off EM radiation of wavelengths in the … Wikipedia
surface analysis — ▪ chemistry Introduction in analytical chemistry (chemistry), the study of that part of a solid that is in contact with a gas or a vacuum. When two phases of matter are in contact, they form an interface. The term surface is usually… … Universalium
Particle-Induced X-ray Emission — or Proton Induced X ray Emission (PIXE) is a technique used in the determining of the elemental make up of a material or sample. When a material is exposed to an ion beam, atomic interactions occur that give off EM radiation of wavelengths in the … Wikipedia
List of chemical analysis methods — A list of chemical analysis methods with acronyms.List of methods* Atomic absorption spectroscopy (AAS) * Atomic emission spectroscopy (AES) * Atomic fluorescence spectroscopy (AFS) * Alpha particle X ray spectrometer (APXS) * Capillary… … Wikipedia
