- self-test hardware
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аппаратные средства самоконтроля
Англо-русский словарь технических терминов. 2005.
Англо-русский словарь технических терминов. 2005.
Built-in self-test — A built in self test (BIST)mechanism within an integrated circuit (IC) is a function that verifies all or a portion of the internal functionality of the IC. For example, a BIST mechanism is provided in advanced fieldbus systems to verify… … Wikipedia
Power-on self-test — (POST) is the common term for a computer, router or printer s pre boot sequence. The same basic sequence is present on all computer architectures. It is the first step of the more general process called initial program load (IPL), booting, or… … Wikipedia
Power On Self-Test — Dieser Artikel oder Abschnitt bedarf einer Überarbeitung. Näheres ist auf der Diskussionsseite angegeben. Hilf mit, ihn zu verbessern, und entferne anschließend diese Markierung. Der Power On Self Test (POST) ist ein Selbsttest nach dem… … Deutsch Wikipedia
power-on self-test — Der POST (von englisch power on self test) ist ein Selbsttest nach dem Einschalten des Computers – ein Vorgang, den der Computer beim Hochfahren durchläuft, um zu prüfen, ob die grundlegenden Komponenten des PCs funktionsfähig sind.… … Deutsch Wikipedia
Self-Monitoring, Analysis, and Reporting Technology — Self Monitoring, Analysis, and Reporting Technology, or S.M.A.R.T. (sometimes written SMART), is a monitoring system for computer hard disks to detect and report on various indicators of reliability, in the hope of anticipating… … Wikipedia
Hardware random number generator — This SSL Accelerator computer card uses a hardware random number generator to generate cryptographic keys to encrypt data sent over computer networks. In computing, a hardware random number generator is an apparatus that generates random numbers… … Wikipedia
Self-Monitoring, Analysis, and Reporting Technology — S.M.A.R.T. (англ. Self Monitoring Analysing and Reporting Technology) технология оценки состояния жёсткого диска встроенной аппаратурой самодиагностики, а также механизм предсказания времени выхода его из строя. Содержание 1 История 2 Описание 3 … Википедия
Self-replicating machine — A self replicating machine is an artificial construct that is theoretically capable of autonomously manufacturing a copy of itself using raw materials taken from its environment. The concept of self replicating machines has been advanced and… … Wikipedia
Joint Test Action Group — (JTAG) is the usual name used for the IEEE 1149.1 standard entitled Standard Test Access Port and Boundary Scan Architecture for test access ports used for testing printed circuit boards using boundary scan.JTAG was an industry group formed in… … Wikipedia
Automatic Test Equipment — (ATE) ist ein allgemeiner Begriff für messtechnische Apparaturen, die von der Chip und Elektronik Industrie während der Produktion zum testen benutzt werden. Integrierter Schaltkreise im Wafertest oder Chip und Modul Test; analoger Bauteile im… … Deutsch Wikipedia
Multi-site test — Multi site test, or multisite test , or concurrent test , or parallel test are all semiconductor Automatic Test Equipment (ATE) terms that generally refer to testing of multiple devices at the same time. Currently, devices refer to System on a… … Wikipedia