reflected electron

reflected electron
отражённый электрон

Англо-русский словарь технических терминов. 2005.

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  • Electron microscope — Diagram of a transmission electron microscope A 197 …   Wikipedia

  • electron diffraction — Physics. the phenomenon whereby electron waves scattered by the regularly spaced atoms of a crystal produce diffraction patterns characteristic of the crystal structure and the wavelength. [1925 30] * * * ▪ physics       interference effects… …   Universalium

  • electron microscopy — Any form of microscopy in which the interactions of electrons with the specimens are used to provide information about the fine structure of that specimen. In transmission electron microscopy (TEM) the diffraction and adsorption of electrons as… …   Dictionary of molecular biology

  • Scanning electron microscope — These pollen grains taken on an SEM show the characteristic depth of field of SEM micrographs …   Wikipedia

  • Environmental scanning electron microscope — Wool fibers imaged in an ESEM by the use of two symmetrical plastic scintillating backscattered electron detectors …   Wikipedia

  • Photoemission electron microscopy — (PEEM, also called photoelectron microscopy, PEM) is a widely used type of emission microscopy. PEEM utilizes local variations in electron emission to generate image contrast. The excitation is usually produced by UV light, synchrotron radiation… …   Wikipedia

  • Free electron model — In three dimensions, the density of states of a gas of fermions is proportional to the square root of the kinetic energy of the particles. In solid state physics, the free electron model is a simple model for the behaviour of valence electrons in …   Wikipedia

  • 18-Electron rule — The 18 electron rule is a rule of thumb used primarily in transition metal chemistry for characterizing and predicting the stability of metal complexes. Valence shells of a transition metal can accommodate 18 electrons: 2 in each of the five d… …   Wikipedia

  • Low-energy electron microscopy — Low energy electron microscopy, or LEEM, is a technique used by surface scientists to study surface structure at mesoscopic scale on conducting and semiconducting materials. It is based on imaging the electrons elastically scattered from the… …   Wikipedia

  • scanning electron microscope — a device in which the specimen is examined point by point directly in a moving electron beam, and electrons reflected by the specimen are used to form a magnified, three dimensional image on a television screen. Abbr.: SEM [1950 55] * * * …   Universalium

  • scanning electron microscope — noun an electron microscope in which the surface of a specimen is scanned by a beam of electrons that are reflected to form an image …   English new terms dictionary


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