- wafer test
1. контроль пластины
2. тест для проверки логической схемы (непосредственно) на пластине
Большой англо-русский и русско-английский словарь. 2001.
wafer test
Смотреть что такое "wafer test" в других словарях:
Wafer Sort Test — Der Wafer Test ist eine Funktionsprüfung im Fertigungsablauf bei der Produktion von integrierten Schaltungen. Er wird an dem noch nicht zerteilten Wafer durchgeführt, um fehlerhafte Schaltungen frühzeitig zu erkennen. Dafür wird der Wafer in ein… … Deutsch Wikipedia
Wafer testing — is a step performed during semiconductor device fabrication. During this step, performed before a wafer is sent to die preparation, all individual integrated circuits that are present on the wafer are tested for functional defects by applying… … Wikipedia
Test microelectronique — Test microélectronique Cet article concerne le test de composants microélectroniques. Plusieurs points seront developpés: Pourquoi tester les composants Lien entre le design et le test Différents test appliqués aux composants Sommaire 1 Raison du … Wikipédia en Français
Wafer-scale integration — Wafer scale integration, WSI for short, is a yet unused system of building very large integrated circuit networks that use an entire silicon wafer to produce a single super chip . Through a combination of large size and reduced packaging, WSI… … Wikipedia
Wafer dicing — is the process by which individual silicon chips or integrated circuits on a silicon wafer are separated following the processing of the wafer. The dicing process can be accomplished by scribing and breaking, by mechanical sawing (normally with a … Wikipedia
Test microélectronique — Cet article concerne le test de composants microélectroniques. Plusieurs points seront developpés: Pourquoi tester les composants Lien entre le design et le test Différents test appliqués aux composants Sommaire 1 Raison du test de composants 1.1 … Wikipédia en Français
Wafer prober — A wafer prober is a machine used to test integrated circuits. OverviewIntegrated circuits are fabricated in large numbers by a complex series of printing steps on silicon wafers. This process permits integrated circuits to be produced cheaply but … Wikipedia
Wafer (electronics) — Polished 12 and 6 silicon wafers. The flat cut into the right wafer indicates its doping and crystallographic orientation (see below) … Wikipedia
test des puces in situ — plokštelės lustų tikrinimas statusas T sritis radioelektronika atitikmenys: angl. on wafer chip testing vok. Chiptesten auf dem Wafer, n; On Wafer Chiptesten, n rus. проверка кристаллов ИС на пластине, f pranc. test des puces in situ, m … Radioelektronikos terminų žodynas
wafer drop-in test chip group — puslaidininkinės plokštelės tikrinamų lustų grupė statusas T sritis radioelektronika atitikmenys: angl. wafer drop in test chip group vok. eingefügte Testchipgruppe, f rus. группа тестовых кристаллов ИС в полупроводниковой пластине, f pranc. jeu… … Radioelektronikos terminų žodynas
Non-contact wafer testing — Wafer testing is a normal step in semiconductor device fabrication, used to detect defects in integrated circuits (IC) before they are assembled during the IC packaging step. Traditional (contact) wafer testing Probing ICs while they are still on … Wikipedia
