- test-vector generation
- генерация тестовых векторов
Большой англо-русский и русско-английский словарь. 2001.
Большой англо-русский и русско-английский словарь. 2001.
Automatic test pattern generation — ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables testers… … Wikipedia
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Design for testing — Design for Test (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and… … Wikipedia
Model-based testing tools — This page lists tools for model based testing in alphabetic order. * [http://www.all4tec.net/index.php?option=com content task=blogcategory id=5 Itemid=75 lang=en All4Tec MaTeLo] is a model based testing tool and an automatic test generator. *… … Wikipedia
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Abkürzungen/Computer — Dies ist eine Liste technischer Abkürzungen, die im IT Bereich verwendet werden. A [nach oben] AA Antialiasing AAA authentication, authorization and accounting, siehe Triple A System AAC Advanced Audio Coding AACS … Deutsch Wikipedia
Liste der Abkürzungen (Computer) — Dies ist eine Liste technischer Abkürzungen, die im IT Bereich verwendet werden. A [nach oben] AA Antialiasing AAA authentication, authorization and accounting, siehe Triple A System AAC Advanced Audio Coding AACS … Deutsch Wikipedia
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Fault coverage — refers to the percentage of some type of fault that can be detected during the test of an electronic system, usually an integrated circuit. High fault coverage is particularly valuable during manufacturing test, and techniques such as Design For… … Wikipedia
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