scan chain
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Scan chain — Scan chains are a technique used in Design For Test. The objective is to make testing easier by providing a simple way to set and observe every flip flop in an IC. A special signal called scan enable is added to a design. When this signal is… … Wikipedia
Scan Test — bezeichnet bei (modernen) digitalen Schaltungen ein spezielles Verfahren zum Testen auf strukturelle (das heißt fertigungsbedingte) Schäden. Es beruht auf einer Hintereinanderschaltung sämtlicher im Entwurf verwendeter Flip Flops mit einer Modus… … Deutsch Wikipedia
Scan-based trading — (SBT) or Scan based trading is the process where suppliers maintain ownership of inventory within retailers warehouses or stores until items are scanned at the point of sale. HistoryTraditionally Scan Based Trading programs use Electronic Data… … Wikipedia
Scan — may refer to: *Scan, the act of examining sequentially, part by part *Image scanning, in data processing, the act of optically analyzing a two or three dimensional image and digitally encode it (digitize it) for storage in a computer file *Scan,… … Wikipedia
Chain Reaction (label) — Chain Reaction Filiale de Basic Channel Fondé en 1995 Fondateur Basic Channel Genre(s) Dub Techno … Wikipédia en Français
Boundary scan — is a method for testing interconnects (wire lines) on printed circuit boards or sub blocks inside an integrated circuit.The Joint Test Action Group (JTAG) developed a specification for boundary scan testing that was standardized in 1990 as the… … Wikipedia
Optical scan voting system — Election technology Certification of voting machines Independent Testing Authority (ITA) NVLAP VVSG End to end auditable voting systems Help America Vote Act Independent verific … Wikipedia
Boundary scan description language — (BSDL) is a description language for electronics testing using JTAG. It has been added 1996 to the IEEE Std. 1149. Boundary Scan Description Language (BSDL) is a subset of VHDL that is used to describe how JTAG (IEEE 1149.1) is implemented in a… … Wikipedia
Joint Test Action Group — (JTAG) is the usual name used for the IEEE 1149.1 standard entitled Standard Test Access Port and Boundary Scan Architecture for test access ports used for testing printed circuit boards using boundary scan.JTAG was an industry group formed in… … Wikipedia
Design for testing — Design for Test (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and… … Wikipedia
Design For Test — (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and apply… … Wikipedia
