- probing device
1. измерительная головка
2. зонд
Большой англо-русский и русско-английский словарь. 2001.
Большой англо-русский и русско-английский словарь. 2001.
probing — probe ► NOUN 1) a blunt ended surgical instrument for exploring a wound or part of the body. 2) a small measuring or testing device, especially an electrode. 3) an investigation. 4) (also space probe) an unmanned exploratory spacecraft. ► VERB 1) … English terms dictionary
probing — prəʊb n. investigation; examination; slim device used in medical examinations; satellite sent into outer space v. investigate, research, study, explore; check, examine, test … English contemporary dictionary
Mercury probe — The Mercury Probe is an electrical probing device to make rapid, non destructive contact to a sample for electrical characterization. Its primary application is semiconductor measurements where time consuming metallizations or photolithographic… … Wikipedia
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Mercury-in-glass thermometer — Closeup of a maximum thermometer. The break in the column of mercury is visible. A mercury in glass thermometer, also known as a mercury thermometer, was invented by German physicist Daniel Gabriel Fahrenheit in 1724 and is a thermometer… … Wikipedia
Probe effect — is unintended alteration in system behavior caused by measuring that system.In code profiling and performance measurements, the delays introduced by insertion/removal of code instrumentation may result in a non functioning application, or… … Wikipedia
Circuit bending — Probing for bends using a jeweler s screwdriver and alligator clips Circuit bending is the creative customization of the circuits within electronic devices such as low voltage, battery powered guitar effects, children s toys and small digital… … Wikipedia
Coordinate-measuring machine — A coordinate measuring machine (CMM) is a device for measuring the physical geometrical characteristics of an object. This machine may be manually controlled by an operator or it may be computer controlled. Measurements are defined by a probe… … Wikipedia
Non-contact wafer testing — Wafer testing is a normal step in semiconductor device fabrication, used to detect defects in integrated circuits (IC) before they are assembled during the IC packaging step. Traditional (contact) wafer testing Probing ICs while they are still on … Wikipedia
Physical Sciences — ▪ 2009 Introduction Scientists discovered a new family of superconducting materials and obtained unique images of individual hydrogen atoms and of a multiple exoplanet system. Europe completed the Large Hadron Collider, and China and India took… … Universalium