negative beam
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Negative index metamaterials — A negative index metamaterial causes light to refract, or bend, differently than in more common positive refractive index materials. Negative index metamaterials or negative index materials (NIM) are artificial structures where the refractive… … Wikipedia
Beam tetrode — The problem of secondary emission in the tetrode tube (valve) was solved by Philips/Mullard with the introduction of a suppressor grid to produce the pentode construction. Since Philips held a patent on this design, other manufacturers were keen… … Wikipedia
Particle beam weapon — A particle beam weapon uses an ultra high energy beam of atoms or electrons (i.e., a particle beam) to damage a material target by hitting it, and thus disrupting its atomic and molecular structure. A particle beam weapon is a type of directed… … Wikipedia
Electron beam lithography — (often abbreviated as e beam lithography) is the practice of scanning a beam of electrons in a patterned fashion across a surface covered with a film (called the resist),cite book |last= McCord |first=M. A. |coauthors=M. J. Rooks |title=… … Wikipedia
Conjugate beam method — (0) real beam, (1) shear and moment, (2) conjugate beam, (3) slope and displacement The conjugate beam method is an engineering method to derive the slope and displacement of a beam. The conjugate beam method was developed by H. Müller Breslau in … Wikipedia
Euler-Bernoulli beam equation — Euler Bernoulli beam theory, or just beam theory, is a simplification of the linear theory of elasticity which provides a means of calculating the load carrying and deflection characteristics of beams. It was first enunciated circa 1750, but was… … Wikipedia
Electron beam physical vapor deposition — or EBPVD is a form of physical vapor deposition in which a target anode is bombarded with an electron beam given off by a charged tungsten filament under high vacuum. The electron beam causes atoms from the target to transform into the gaseous… … Wikipedia
Direct integration of a beam — Direct integration is a structural analysis method for measuring internal shear, internal moment, rotation, and deflection of a beam. Positive directions for forces acting on an element. For a beam with an applied weight w(x), taking downward to… … Wikipedia
Electron beam ion trap — (or its acronym EBIT) is used in physics to denote an electromagnetic bottle that produces and confines highly charged ions. It was invented by R. Marrs [Levine et al, 1988] and M. Levine at LLNL.An EBIT uses an electron beam focused by means of… … Wikipedia
Proximity effect (electron beam lithography) — The proximity effect in electron beam lithography (EBL) is the phenomenon that the exposure dose distribution, and hence the developed pattern, is wider than the scanned pattern, due to the interactions of the primary beam electrons with the… … Wikipedia
Electron Beam Ion Source — Eine Electron Beam Ion Trap (EBIT, Elektronenstrahl Ionenfalle) ist eine spezielle Art von Ionenfalle. Dieser Typ Falle eignet sich insbesondere für die Erzeugung und Speicherung hochgeladener Ionen. In ihr werden niedriggeladene Ionen… … Deutsch Wikipedia
