- logic under test
- проверяемые логические схемы
Большой англо-русский и русско-английский словарь. 2001.
logic under test
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Test-driven development — (TDD ) is a software development technique consisting of short iterations where new test cases covering the desired improvement or new functionality are written first, then the production code necessary to pass the tests is implemented, and… … Wikipedia
Logic analyzer — A logic analyzer is an electronic instrument which displays signals in a digital circuit. A logic analyzer may convert the captured data into timing diagrams, protocol decodes, state machine traces, assembly language, or correlate assembly with… … Wikipedia
Test probe — Typical passive oscilloscope probe being used for testing an integrated circuit. A test probe (test lead, test prod, or scope probe) is a physical device used to connect electronic test equipment to the device under test (DUT). They range from… … Wikipedia
Logic probe — A logic probe is a hand held pen like test probe used for analyzing and troubleshooting the logical states (Boolean 0 or 1) of a digital circuit. While most are powered by the circuit under test, some devices use batteries. They can be used on… … Wikipedia
logic, history of — Introduction the history of the discipline from its origins among the ancient Greeks to the present time. Origins of logic in the West Precursors of ancient logic There was a medieval tradition according to which the Greek philosopher … Universalium
Logic puzzle — Part of a series on Puzzles … Wikipedia
Test-and-set — In computer science, the test and set instruction is an instruction used to both test and (conditionally) write to a memory location as part of a single atomic (i.e. non interruptible) operation. This means setting a value, but first performing… … Wikipedia
Design For Test — (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and apply… … Wikipedia
Automatic test pattern generation — ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables testers… … Wikipedia
Electronic test equipment — (sometimes called testgear ) is used to create signals and capture responses from electronic Devices Under Test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced and repaired. Use of… … Wikipedia
Joint Test Action Group — (JTAG) is the usual name used for the IEEE 1149.1 standard entitled Standard Test Access Port and Boundary Scan Architecture for test access ports used for testing printed circuit boards using boundary scan.JTAG was an industry group formed in… … Wikipedia
