- focused beam microscope
- растровый микроскоп
Большой англо-русский и русско-английский словарь. 2001.
Большой англо-русский и русско-английский словарь. 2001.
Focused ion beam — Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor and materials science fields for site specific analysis, deposition, and ablation of materials. The FIB is a scientific instrument that resembles a… … Wikipedia
microscope — /muy kreuh skohp /, n. 1. an optical instrument having a magnifying lens or a combination of lenses for inspecting objects too small to be seen or too small to be seen distinctly and in detail by the unaided eye. 2. (cap.) Astron. the… … Universalium
Microscope — An optical instrument that augments the power of the eye to see small objects. The name microscope was coined by Johannes Faber (1574 1629) who in 1628 borrowed from the Greek to combined micro , small with skopein, to view. Although the first… … Medical dictionary
Microscope — This article is about microscopes in general. For light microscopes, see optical microscope. Microscope Us … Wikipedia
Electron beam induced deposition — (EBID) is a process of decomposing gaseous molecules by electron beam leading to deposition of non volatile fragments onto a nearby substrate. Process Focused electron beam of scanning electron microscope (SEM) or scanning transmission electron… … Wikipedia
Optical microscope — Microscope Uses Small sample observation Notable experiments Discovery of cells Inventor Hans Lippershey Zacharias Jans … Wikipedia
Electron microscope — Diagram of a transmission electron microscope A 197 … Wikipedia
Environmental scanning electron microscope — Wool fibers imaged in an ESEM by the use of two symmetrical plastic scintillating backscattered electron detectors … Wikipedia
Scanning electron microscope — These pollen grains taken on an SEM show the characteristic depth of field of SEM micrographs … Wikipedia
Scanning Helium Ion Microscope — Ein Helium Ionen Mikroskop (auch: Scanning Helium Ion Microscope, SHIM) ist ein bildgebendes Verfahren, welches darauf basiert, dass ein Helium Ionen Strahl das zu untersuchende Objekt abtastet[1]. Das Verfahren ähnelt dem eines… … Deutsch Wikipedia
Near-field scanning optical microscope — Near field scanning optical microscopy (NSOM/SNOM) is a microscopic technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. This is done by placing the detector very… … Wikipedia