- design-for-test logic
- удоботестируемые логическиес схемы;
контролепригодные логические схемы
Большой англо-русский и русско-английский словарь. 2001.
Большой англо-русский и русско-английский словарь. 2001.
Design For Test — (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and apply… … Wikipedia
Design for testing — Design for Test (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and… … Wikipedia
Design closure — is the process by which a VLSI design is modified from its initial description to meet a growing list of design constraints and objectives. Every step in the IC design (such as static timing analysis, placement, routing, and so on) is already… … Wikipedia
Design of experiments — In general usage, design of experiments (DOE) or experimental design is the design of any information gathering exercises where variation is present, whether under the full control of the experimenter or not. However, in statistics, these terms… … Wikipedia
Test (student assessment) — A test or an examination (or exam ) is an assessment, often administered on paper or on the computer, intended to measure the test takers or respondents (often a student) knowledge, skills, aptitudes, or classification in many other topics (e.g … Wikipedia
Electronic design automation — (EDA) is the category of tools for designing and producing electronic systems ranging from printed circuit boards (PCBs) to integrated circuits. This is sometimes referred to as ECAD (electronic computer aided design) or just CAD. (Printed… … Wikipedia
Test-driven development — (TDD ) is a software development technique consisting of short iterations where new test cases covering the desired improvement or new functionality are written first, then the production code necessary to pass the tests is implemented, and… … Wikipedia
Integrated circuit design — Layout view of a simple CMOS Operational Amplifier ( inputs are to the left and the compensation capacitor is to the right ). The metal layers are colored blue and green, the polysilicon is red and vias are crosses. Integrated circuit design, or… … Wikipedia
Automatic test pattern generation — ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables testers… … Wikipedia
Logic simulation — is the use of a computer program to simulate the operation of a digital circuit. Logic simulation is the primary tool used for verifying the logical correctness of a hardware design. In many cases logic simulation is the first activity performed… … Wikipedia
Built-in self-test — A built in self test (BIST)mechanism within an integrated circuit (IC) is a function that verifies all or a portion of the internal functionality of the IC. For example, a BIST mechanism is provided in advanced fieldbus systems to verify… … Wikipedia