- deep-level defect
- дефект на глубоком уровне
Большой англо-русский и русско-английский словарь. 2001.
deep-level defect
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Deep-level transient spectroscopy — (DLTS) is an experimental tool for studying electrically active defects (known as charge carrier traps) in semiconductors. DLTS establishes fundamental defect parameters and measures their concentration in the material. Some of the parameters are … Wikipedia
Deep-level trap — Deep level traps or deep level defects are a generally undesirable type of electronic defect in semiconductors. They are deep in the sense that the energy required to remove an electron or hole from the trap to the valence or conduction band is… … Wikipedia
Deep vein thrombosis — DVT redirects here. For other uses, see DVT (disambiguation). Deep vein thrombosis Classification and external resources A deep vein thrombosis in the right leg. Note the swelling and redness. ICD 10 … Wikipedia
Crystallographic defect — Crystalline solids exhibit a periodic crystal structure. The positions of atoms or molecules occur on repeating fixed distances, determined by the unit cell parameters. However, the arrangement of atom or molecules in most crystalline materials… … Wikipedia
дефект на глубоком уровне — — [http://slovarionline.ru/anglo russkiy slovar neftegazovoy promyishlennosti/] Тематики нефтегазовая промышленность EN deep level defect … Справочник технического переводчика
South Africa — Republic of, a country in S Africa; member of the Commonwealth of Nations until 1961. 42,327,458; 472,000 sq. mi. (1,222,480 sq. km). Capitals: Pretoria and Cape Town. Formerly, Union of South Africa. * * * South Africa Introduction South Africa… … Universalium
Lau Wai Shing — Wai Shing Lau (simplified Chinese name: 刘偉成, born July 29, 1955 in Hong Kong) is also known as Lau Wai Shing. The family name of Lau is sometimes spelled as Liu like Liu Bang (founder of the Han dynasty) or Liu Shaoqi or Liu Bocheng. This is… … Wikipedia
Radiation hardening — is a method of designing and testing electronic components and systems to make them resistant to damage or malfunctions caused by ionizing radiation (particle radiation and high energy electromagnetic radiation),[1] such as would be encountered… … Wikipedia
Failure analysis — is the process of collecting and analyzing data to determine the cause of a failure. It is an important discipline in many branches of manufacturing industry, such as the electronics industry, where it is a vital tool used in the development of… … Wikipedia
Capacitance voltage profiling — The CV , or more correctly C V , in C V profiling, stands for capacitance voltage, and refers to a technique used for characterization of semiconductor materials and devices. The technique uses a metal semiconductor junction (Schottky barrier) or … Wikipedia
Carrier scattering — Defect types include atom vacancies, adatoms, steps, and kinks which occur most frequently at surfaces due to finite material size causing crystal discontinuity. What all types of defects have in common, whether they be surface or bulk, is that… … Wikipedia
