current beam
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Beam-powered propulsion — is a class of spacecraft propulsion mechanisms that use energy beamed to the spacecraft from a remote power plant. Most designs are rocket engines where the energy is provided by the beam, and is used to superheat propellant that then provides… … Wikipedia
Beam search — is a heuristic search algorithm that is an optimization of best first search that reduces its memory requirement. Best first search is a graph search which orders all partial solutions (states) according to some heuristic which attempts to… … Wikipedia
Beam tetrode — The problem of secondary emission in the tetrode tube (valve) was solved by Philips/Mullard with the introduction of a suppressor grid to produce the pentode construction. Since Philips held a patent on this design, other manufacturers were keen… … Wikipedia
BEAM robotics — The word beam in BEAM robotics is an acronym for Biology, Electronics, Aesthetics, and Mechanics . This is a term that refers to a style of robotics that primarily uses simple analog circuits, such as comparators, instead of a microprocessor in… … Wikipedia
Current integrator — A current integrator is an electronic device performing a time integration of an electric current, thus measuring a total electric charge.One application of current integration is in ion beam deposition, where the measured charge directly… … Wikipedia
Electron beam lithography — (often abbreviated as e beam lithography) is the practice of scanning a beam of electrons in a patterned fashion across a surface covered with a film (called the resist),cite book |last= McCord |first=M. A. |coauthors=M. J. Rooks |title=… … Wikipedia
Laser beam profiler — A laser beam profiler captures, displays, and records the spatial intensity profile of a laser beam at a particular plane transverse to the beam propagation path. Since there are many types of lasers ultraviolet, visible, infrared, continuous… … Wikipedia
Electron beam induced current — (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is used to identify buried junctions or defects in semiconductors, or to examine minority… … Wikipedia
Electron beam welding — (EBW) is a fusion welding process in which a beam of high velocity electrons is applied to the materials being joined. The workpieces melt as the kinetic energy of the electrons is transformed into heat upon impact, and the filler metal, if used … Wikipedia
Charged particle beam — A charged particle beam is a spatially localized group of electrically charged particles that have approximately the same velocity (speed and direction). The kinetic energies of the particles are typically measured in keV or MeV, much larger than … Wikipedia
Focused ion beam — Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor and materials science fields for site specific analysis, deposition, and ablation of materials. The FIB is a scientific instrument that resembles a… … Wikipedia
