- X-ray diffraction instrument
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• рентгеновский спектрометр• установка для рентгеноструктурного анализа
Англо-русский словарь терминов металлургии и сварки. 2011.
X-ray diffraction instrument
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Diffraction-limited system — Memorial to Ernst Karl Abbe, who approximated the diffraction limit of a microscope as , where d is the resolvable feature size, λ is the wavelength of light, n is the index of refraction of the medium being imaged in, and θ (depicted as α in the … Wikipedia
Ray tracing (physics) — In physics, ray tracing is a method for calculating the path of waves or particles through a system with regions of varying propagation velocity, absorption characteristics, and reflecting surfaces. Under these circumstances, wavefronts may bend … Wikipedia
Powder diffraction — is a scientific technique using X ray, neutron, or electron diffraction on powder or microcrystalline samples for structural characterization of materials. [B.D. Cullity Elements of X ray Diffraction Addison Wesley Mass. 1978] Explanation Ideally … Wikipedia
Neutron diffraction — Science with Neutrons Foundations Neutron temperature Flux · Radiation … Wikipedia
Low-energy electron diffraction — (LEED) is a technique used to characterize the structures of surfaces.History =Davisson and Germer s discovery of electron diffraction= The development of electron diffraction was closely linked to the progress of quantum mechanics and atomic… … Wikipedia
X-ray microscope — n an instrument in which X ray diffraction patterns of crystals are translated into pictures showing the relative positions of the atoms in a crystal as if in a photomicrograph of very high magnification * * * a microscope in which a beam of x… … Medical dictionary
x-ray microscope — noun Usage: usually capitalized X : an instrument in which X ray diffraction patterns of crystals are translated into pictures showing the relative positions of the atoms in a crystal as if in a photomicrograph of very high magnification … Useful english dictionary
X-ray fluorescence — (XRF) is the emission of characteristic secondary (or fluorescent) X rays from a material that has been excited by bombarding with high energy X rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis,… … Wikipedia
X-ray photoelectron spectrometry — Spectrométrie de fluorescence X Pour les articles homonymes, voir SFX, FX et XRF. Un spectromètre de fluorescence X Philips PW1606 avec manutention automatiq … Wikipédia en Français
Reflection high energy electron diffraction — (RHEED) is a technique used to characterize the surface of crystalline materials. RHEED systems gather information only from the surface layer of the sample, which distinguishes RHEED from other materials characterization methods that rely also… … Wikipedia
X-ray nanoprobe — The hard x ray nanoprobe being built for the Center for Nanoscale Materials (CNM), Argonne National Lab will advance the state of the art by providing a hard X ray microscopy beamline with the highest spatial resolution in the world. It will… … Wikipedia
