probing device
1probing — probe ► NOUN 1) a blunt ended surgical instrument for exploring a wound or part of the body. 2) a small measuring or testing device, especially an electrode. 3) an investigation. 4) (also space probe) an unmanned exploratory spacecraft. ► VERB 1) …
2probing — prəʊb n. investigation; examination; slim device used in medical examinations; satellite sent into outer space v. investigate, research, study, explore; check, examine, test …
3Mercury probe — The Mercury Probe is an electrical probing device to make rapid, non destructive contact to a sample for electrical characterization. Its primary application is semiconductor measurements where time consuming metallizations or photolithographic… …
4Ninja — Shinobi redirects here. For the video game series, see Shinobi (series). For other uses, see Shinobi (disambiguation). For other uses, see Ninja (disambiguation) …
5Mercury switch — A Single Pole, Single Throw (SPST) mercury switch on millimetre graph paper …
6Mercury-in-glass thermometer — Closeup of a maximum thermometer. The break in the column of mercury is visible. A mercury in glass thermometer, also known as a mercury thermometer, was invented by German physicist Daniel Gabriel Fahrenheit in 1724 and is a thermometer… …
7Probe effect — is unintended alteration in system behavior caused by measuring that system.In code profiling and performance measurements, the delays introduced by insertion/removal of code instrumentation may result in a non functioning application, or… …
8Circuit bending — Probing for bends using a jeweler s screwdriver and alligator clips Circuit bending is the creative customization of the circuits within electronic devices such as low voltage, battery powered guitar effects, children s toys and small digital… …
9Coordinate-measuring machine — A coordinate measuring machine (CMM) is a device for measuring the physical geometrical characteristics of an object. This machine may be manually controlled by an operator or it may be computer controlled. Measurements are defined by a probe… …
10Non-contact wafer testing — Wafer testing is a normal step in semiconductor device fabrication, used to detect defects in integrated circuits (IC) before they are assembled during the IC packaging step. Traditional (contact) wafer testing Probing ICs while they are still on …
