probe testing
1Probe — may refer to:Media and entertainment* Probe (1972 TV pilot), a pilot for the sci fi series Search * Probe (TV series), a 1988 series * Probe (Philippine TV series) * Probe Records, a record label * Probe Entertainment, a British videogame… …
2probe — ► NOUN 1) a blunt ended surgical instrument for exploring a wound or part of the body. 2) a small measuring or testing device, especially an electrode. 3) an investigation. 4) (also space probe) an unmanned exploratory spacecraft. ► VERB 1)… …
3probe — [prōb] n. [LL proba, proof (in ML, examination) < L probare, to test, prove < probus, good, proper < IE * probhwos (> Sans prabhúḥ, outstanding) < base * pro, forward + * bhū, to grow > BE] 1. a slender, blunt surgical… …
4Probe card — A probe card is an interface between an electronic test system and a semiconductor wafer. Its purpose is to provide an electrical path between the test system and the circuits on the wafer, thereby permitting the testing and validation of the… …
5probe — [c]/proʊb / (say prohb) verb (probed, probing) –verb (t) 1. to search into or examine thoroughly; question closely. 2. to conduct an official inquiry into. 3. to examine or explore as with a probe. –verb (i) 4. to penetrate or examine with or as… …
6probe — n. & v. n. 1 a penetrating investigation. 2 any small device, esp. an electrode, for measuring, testing, etc. 3 a blunt ended surgical instrument usu. of metal for exploring a wound etc. 4 (in full space probe) an unmanned exploratory spacecraft… …
7probe — I. noun Etymology: Medieval Latin proba examination, from Latin probare Date: 1580 1. a slender medical instrument used especially for exploration (as of a wound or body cavity) 2. a. any of various testing devices or substances: as (1) a pointed …
8probe — noun 1》 a blunt ended surgical instrument for exploring a wound or part of the body. ↘a small measuring or testing device, especially an electrode. 2》 an investigation into a crime or other matter. 3》 (also space probe) an unmanned… …
9Flying probe — test systems are often used for only testing basic production, prototypes, and boards that present accessibility problems. Flying probe testing uses electro mechanically controlled probes to access components on printed circuit assemblies (PCAs) …
10Non-contact wafer testing — Wafer testing is a normal step in semiconductor device fabrication, used to detect defects in integrated circuits (IC) before they are assembled during the IC packaging step. Traditional (contact) wafer testing Probing ICs while they are still on …