non-contact atomic force microscopy
1Photoconductive atomic force microscopy — (pc AFM) is a scientific technique.. Multi layer photovoltaic cells have gained popularity since mid 1980s.[1] At the time, research was primarily focused on single layer photovoltaic (PV) devices between two electrodes, in which PV properties… …
2Atomic force microscope — The atomic force microscope (AFM) or scanning force microscope (SFM) is a very high resolution type of scanning probe microscope, with demonstrated resolution of fractions of a nanometer, more than 1000 times better than the optical diffraction… …
3Electrostatic force microscope — Electrostatic force microscopy (EFM) is a type of dynamic non contact atomic force microscopy where the electrostatic force is probed. ( Dynamic here means that the cantilever is oscillating and does not make contact with the sample). This force… …
4Force spectroscopy — is a dynamic analytical technique that allows the study of the mechanical properties of single polymer molecules or proteins, or individual chemical bonds. It is performed by pulling on the system under scrutiny with controlled forces. As a… …
5Scanning probe microscopy — Part of a series of articles on Nanotechnology …
6Magnetic force microscope — MFM images of 3.2 GB and 30 GB computer hard drive surfaces. Magnetic force microscope (MFM) is a variety of atomic force microscope, where a sharp magnetized tip scans a magnetic sample; the tip sample magnetic interactions are detected and used …
7Mechanosynthesis — Part of a series of articles on Molecular Nanotechnology …
8NC-AFM — non contact mode atomic force microscopy …
9NC-AFM — • non contact mode atomic force microscopy …
10Near-field scanning optical microscope — Near field scanning optical microscopy (NSOM/SNOM) is a microscopic technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. This is done by placing the detector very… …
