laser-induced current
1Optical beam induced current — (OBIC) is a semiconductor analysis technique performed using laser signal injection. The technique uses a scanning laser beam to create electron–hole pairs in a semiconductor sample. This induces a current which may be analyzed to determine the… …
2Laser — For other uses, see Laser (disambiguation). United States Air Force laser experiment …
3Laser diode — Top: a packaged laser diode shown with a penny for scale. Bottom: the laser diode chip is removed from the above package and placed on the eye of a needle for scale …
4Nd:YAG laser — with lid open showing frequency doubled 532 nm green light Nd:YAG laser rod …
5Laboratory for Laser Energetics — LLE redirects here. For other uses, see LLE (disambiguation). Laboratory for Laser Energetics Motto A unique national resource …
6Optical beam-induced currents — Optical Beam Induced Current (OBIC) is a semiconductor analysis technique that employs a scanning laser beam to induce a current flow within a semiconductor sample which may be collected and analyzed to generate images that represent the sample s …
7Thermal laser stimulation — represents a class of defect imaging techniques which employ a laser to produce a thermal variation in a semiconductor device. [Harvnb|Beaudoin|Desplats|Perdue|Boit|2004] This technique may be used for semiconductor failure analysis. There are… …
8Distributed feedback laser — A distributed feedback laser (DFB) is a type of laser diode, quantum cascade laser or optical fibre laser where the active region of the device is periodically structured as a diffraction grating. The structure builds a one dimensional… …
9Electromagnetically induced transparency — The effect of EIT on a typical absorption line. A weak probe normally experiences absorption shown in blue. A second coupling beam induces EIT and creates a window in the absorption region (red). This plot is a computer simulation of EIT in an… …
10Light induced voltage alteration — (LIVA) is a semiconductor analysis technique that uses a laser or infrared light source to induce voltage changes in a device while scanning the beam of light across its surface. The technique relies upon the generation of electron hole pairs in… …
