atomic force microscope
1Atomic force microscope — Microscope à force atomique Pour les articles homonymes, voir AFM et Microscope. Le premier microscope à force ato …
2atomic force microscope — n an instrument used for mapping the atomic scale topography of a surface by means of the repulsive electronic forces between the surface and the tip of a microscopic probe moving above the surface abbr. AFM …
3Atomic Force Microscope — Atomic Force Microscope (AFM) Атомно силовой микроскоп (АСМ) Прибор для изучения поверхности твердых тел, основанный на сканировании острием (иглой) кантилевера (зонда) поверхности и одновременном измерении атомно силового взаимодействия… …
4Atomic force microscope — The atomic force microscope (AFM) or scanning force microscope (SFM) is a very high resolution type of scanning probe microscope, with demonstrated resolution of fractions of a nanometer, more than 1000 times better than the optical diffraction… …
5atomic force microscope — atominės jėgos mikroskopas statusas T sritis chemija apibrėžtis Mikroskopas paviršiaus ypatumams tirti kontroliuojant specialaus zondo sąveikos su paviršiumi jėgą. atitikmenys: angl. atomic force microscope rus. микроскоп атомной силы …
6atomic force microscope — noun A device used to map the atomic structure of a surface by measuring the force acting on the very fine tip of a wire moved over the surface See Also: atomic force microscopy …
7atomic force microscope — A type of scanning probe microscope that images a surface by moving a sharp probe over the surface at a constant distance; a very small amount of force is exerted on the tip and probe movement is followed with a laser …
8atomic force microscopy — n the art or process of using an atomic force microscope abbr. AFM …
9Magnetic force microscope — MFM images of 3.2 GB and 30 GB computer hard drive surfaces. Magnetic force microscope (MFM) is a variety of atomic force microscope, where a sharp magnetized tip scans a magnetic sample; the tip sample magnetic interactions are detected and used …
10Electrostatic force microscope — Electrostatic force microscopy (EFM) is a type of dynamic non contact atomic force microscopy where the electrostatic force is probed. ( Dynamic here means that the cantilever is oscillating and does not make contact with the sample). This force… …
